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008190213t19851984onca    ob   f000 0 eng d
020 |z0660119447|q(print)
040 |aCaOODSP|beng|erda|cCaOODSP
041 |aeng|bfre
043 |an-cn---
0861 |aM38-13/84-15E-PDF|zM38-13/84-15E
1001 |aLeduc, J. |q(Jean), |d1943- |eauthor.
24510|aImpedance measurements at the semiconductor-solution interface / |cJ. Leduc and S.M. Ahmed.
264 1|aOttawa, Canada : |bCanada Centre for Mineral and Energy Technology = Centre canadien de la technologie des minéraux et de l'énergie, |c1985.
264 4|c©1984
300 |a1 online resource (iv, 82 pages) : |billustrations.
336 |atext|btxt|2rdacontent
337 |acomputer|bc|2rdamedia
338 |aonline resource|bcr|2rdacarrier
4901 |aCANMET report ; |v84-15E
500 |aIssued also in French under title: Mesures de l'impédance à l'interface semi-conducteur-solution.
500 |aCover title.
500 |a"June 1985."
500 |aIssued by: Energy Research Program and Mineral Sciences Laboratories.
500 |aDigitized edition from print [produced by Natural Resources Canada].
504 |aIncludes bibliographical references.
5203 |a"The physics and chemistry of the semiconductor-solution interface have been presented in detail with particular reference to impedance measurements and determination of the flat band potential of the semiconductor surface. The basic theory of A.C. circuits applied to impedance measurements at the semiconductor-solution interface has been developed. Techniques for impedance measurements and data analysis have been described for a method using an LCR meter and a computer for experimental control and data acquisition. The necessary software has been developed"--Abstract, page i.
546 |aIncludes abstract in French.
69207|2gccst|aChemistry
7001 |aAhmed, S. M. |q(Syed M.), |d1943- |eauthor.
7101 |aCanada. |bEnergy, Mines and Resources Canada.
7102 |aCanada Centre for Mineral and Energy Technology.
7102 |aEnergy Research Program (Canada)
7102 |aMineral Sciences Laboratories (Canada)
77508|tMesures de l'impédance à l'interface semi-conducteur-solution / |w(CaOODSP)9.868285
830#0|aCANMET report ;|v84-15E.|w(CaOODSP)9.852792
85640|qPDF|s5.44 MB|uhttps://publications.gc.ca/collections/collection_2019/rncan-nrcan/m38-13/M38-13-84-15-eng.pdf