00000nam 2200000za 4500 9.821958 CaOODSP 20230131161137 cr ||||||||||| 160803s2013 onc |o f000 0 eng d CaOODSP eng n-cn--- M41-11/18-2013E-PDF On-site analysis of wetland surface-water samples by total reflection x-ray fluorescence spectrometry [electronic resource] / P. Pelchat ... [et al.]. [Ottawa] : Geological Survey of Canada, Natural Resources Canada, 2013. 1 poster : table, photos, graphs. Geological Survey of Canada, Scientific Presentation ; 18 "Presented at the 59th International Conference on Analytical Sciences and Spectroscopy (ICASS), Date presented: June 2013." For many geochemical studies, the very low detection limits of Inductively Coupled Plasma (ICP) technology are less important than the time delay and high costs associated with laboratory based analysis. Total reflection X-ray fluorescence spectroscopy (TXRF), with on-site analyses at low ppb level detection limits, offers a potential compromise. To test whether this is a suitable field technology, the Geological Survey of Canada’s TGI4 Program, in conjunction with the Inorganic Geochemical Research Laboratory (IGRL), deployed a TXRF Spectrometer (Bruker AXS – S2 Picofox) and a small field laboratory to a remote field location in Saskatchewan. ... gccst Geochemistry gccst Hydrogeology gccst Surface water Spectroscopy X-ray fluorescence Pelchat, P. Canada. Natural Resources Canada. Geological Survey of Canada. International Conference on Analytical Sciences and Spectroscopy (59th : 2013 : Mont-Tremblant (Québec)) Scientific presentation (Geological Survey of Canada) 18 (CaOODSP)9.820265 PDF 5.86 MB https://publications.gc.ca/collections/collection_2016/rncan-nrcan/M41-11-18-2013-eng.pdf doi:10.4095/293043