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008160803s2013    onc    |o    f000 0 eng d
040 |aCaOODSP|beng
043 |an-cn---
0861 |aM41-11/18-2013E-PDF
24500|aOn-site analysis of wetland surface-water samples by total reflection x-ray fluorescence spectrometry |h[electronic resource] / |cP. Pelchat ... [et al.].
260 |a[Ottawa] : |bGeological Survey of Canada, Natural Resources Canada, |c2013.
300 |a1 poster : |btable, photos, graphs.
4901 |aGeological Survey of Canada, Scientific Presentation ; |v18
500 |a"Presented at the 59th International Conference on Analytical Sciences and Spectroscopy (ICASS), Date presented: June 2013."
520 |aFor many geochemical studies, the very low detection limits of Inductively Coupled Plasma (ICP) technology are less important than the time delay and high costs associated with laboratory based analysis. Total reflection X-ray fluorescence spectroscopy (TXRF), with on-site analyses at low ppb level detection limits, offers a potential compromise. To test whether this is a suitable field technology, the Geological Survey of Canada’s TGI4 Program, in conjunction with the Inorganic Geochemical Research Laboratory (IGRL), deployed a TXRF Spectrometer (Bruker AXS – S2 Picofox) and a small field laboratory to a remote field location in Saskatchewan. ...
69207|2gccst|aGeochemistry
69207|2gccst|aHydrogeology
69207|2gccst|aSurface water
693 4|aSpectroscopy
693 4|aX-ray fluorescence
7001 |aPelchat, P.
7101 |aCanada. |bNatural Resources Canada.
7102 |aGeological Survey of Canada.
7112 |aInternational Conference on Analytical Sciences and Spectroscopy|n(59th : |d2013 : |cMont-Tremblant (Québec))
830#0|aScientific presentation (Geological Survey of Canada)|v18|w(CaOODSP)9.820265
85640|qPDF|s5.86 MB|uhttps://publications.gc.ca/collections/collection_2016/rncan-nrcan/M41-11-18-2013-eng.pdf