000 01465cam  2200325za 4500
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008181121s1975    onc    #ot   f|0| 0 eng d
040 |aCaOODSP|beng
041 |aeng|bfre
043 |an-cn---
0861 |aM38-13/76-6E-PDF|zM38-13/76-6
1001 |aMilliken, K. S.
24510|aOn the determination of the lattice type and unit cell parameters of a crystal using electron diffraction |h[electronic resource] / |cK. S. Milliken.
260 |a[Ottawa] : |bEnergy, Mines and Resources Canada, |c1975.
300 |aii, 13 p.
4901 |aCANMET report ; |v76-6E
500 |aCover title.
500 |a"November 1975."
504 |aIncludes bibliographic references.
520 |a"The goniometer stage of a Philips EM300 transmission electron microscope has been used as a measuring device in lattice determination. Hewlett-Packard 9810A programs have been written to control the lattice calculations. The use of the programs is described and two examples are given"--Abstract., p. i.
546 |aIncludes abstract in French.
69207|2gccst|aScientific research
69207|2gccst|aMinerals
69207|2gccst|aSoftware
7101 |aCanada. |bEnergy, Mines and Resources Canada.
830#0|aCANMET report ;|v76-6E.|w(CaOODSP)9.852792
85640|qPDF|s547 KB|uhttps://publications.gc.ca/collections/collection_2018/rncan-nrcan/m38-13/M38-13-76-6-eng.pdf