The MP-SEM-IPS image analysis system / W. Petruk.: M38-13/87-1E-PDF
"Image analysis is a technique for determining mineral quantities, grain size distributions, grain orientations, mineral intergrowths, mineral associations, and degrees of alteration of minerals in rocks and ores. It is performed by analysing images of polished or thin sections of the material under study. To be universally applicable to mineralogical and geochemical studies the image must be a faithful reproduction of the material, and each mineral displayed in it must be distinct enough to be discriminated and automatically identified during analysis. An image analysis system that meets these requirements was developed in the Process Mineralogy Section at CANMET by interfacing a Jeol 733 microprobe, A Tracor Northern 2000 energy dispersive X-ray analyser (EDXA), and a Kontron SEM-IPS image analyser with two-way communication between all units. The analytical procedure involves transferring a backscattered electron image (BSE) from the microprobe to the image analyser and discriminating the minerals on the basis of their grey levels in the image"--Abstract, p. i.
Permanent link to this Catalogue record:
publications.gc.ca/pub?id=9.866542&sl=0
| Department/Agency | Canada. Natural Resources Canada. Canada Centre for Mineral and Energy Technology. Mineral Processing Laboratory (Canada) Mineral Sciences Laboratories (Canada) |
|---|---|
| Title | The MP-SEM-IPS image analysis system / W. Petruk. |
| Series title | CANMET report ; 87-1E |
| Publication type | Series - View Master Record |
| Language | [English] |
| Format | Electronic |
| Electronic document | |
| Note(s) | "June 1986." Title from cover. Includes bibliographical references. Includes abstract in French. |
| Publishing information | Ottawa : Mineral Processing Laboratory, Mineral Sciences Laboratories, 1986, c1987. |
| Author / Contributor | Petruk, W., 1930- |
| Description | vi, 28 p. : ill., graphs, photographs |
| Catalogue number |
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| Subject terms | Minerals Analysis Systems |
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