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| 02613cam 2200469zi 4500 |
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001 | 9.868283 |
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003 | CaOODSP |
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005 | 20221107162537 |
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006 | m o d f |
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007 | cr nn||||||||| |
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008 | 190213t19851984onca ob f000 0 eng d |
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020 | |z0660119447|q(print) |
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040 | |aCaOODSP|beng|erda|cCaOODSP |
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041 | |aeng|bfre |
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043 | |an-cn--- |
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086 | 1 |aM38-13/84-15E-PDF|zM38-13/84-15E |
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100 | 1 |aLeduc, J. |q(Jean), |d1943- |eauthor. |
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245 | 10|aImpedance measurements at the semiconductor-solution interface / |cJ. Leduc and S.M. Ahmed. |
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264 | 1|aOttawa, Canada : |bCanada Centre for Mineral and Energy Technology = Centre canadien de la technologie des minéraux et de l'énergie, |c1985. |
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264 | 4|c©1984 |
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300 | |a1 online resource (iv, 82 pages) : |billustrations. |
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336 | |atext|btxt|2rdacontent |
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337 | |acomputer|bc|2rdamedia |
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338 | |aonline resource|bcr|2rdacarrier |
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490 | 1 |aCANMET report ; |v84-15E |
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500 | |aIssued also in French under title: Mesures de l'impédance à l'interface semi-conducteur-solution. |
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500 | |aCover title. |
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500 | |a"June 1985." |
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500 | |aIssued by: Energy Research Program and Mineral Sciences Laboratories. |
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500 | |aDigitized edition from print [produced by Natural Resources Canada]. |
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504 | |aIncludes bibliographical references. |
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520 | 3 |a"The physics and chemistry of the semiconductor-solution interface have been presented in detail with particular reference to impedance measurements and determination of the flat band potential of the semiconductor surface. The basic theory of A.C. circuits applied to impedance measurements at the semiconductor-solution interface has been developed. Techniques for impedance measurements and data analysis have been described for a method using an LCR meter and a computer for experimental control and data acquisition. The necessary software has been developed"--Abstract, page i. |
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546 | |aIncludes abstract in French. |
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692 | 07|2gccst|aChemistry |
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700 | 1 |aAhmed, S. M. |q(Syed M.), |d1943- |eauthor. |
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710 | 1 |aCanada. |bEnergy, Mines and Resources Canada. |
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710 | 2 |aCanada Centre for Mineral and Energy Technology. |
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710 | 2 |aEnergy Research Program (Canada) |
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710 | 2 |aMineral Sciences Laboratories (Canada) |
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775 | 08|tMesures de l'impédance à l'interface semi-conducteur-solution / |w(CaOODSP)9.868285 |
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830 | #0|aCANMET report ;|v84-15E.|w(CaOODSP)9.852792 |
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856 | 40|qPDF|s5.44 MB|uhttps://publications.gc.ca/collections/collection_2019/rncan-nrcan/m38-13/M38-13-84-15-eng.pdf |
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