| 000 | 00000nam 2200000zi 4500 |
| 001 | 9.954255 |
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| 003 | CaOODSP |
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| 005 | 20250922124204 |
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| 006 | m o d f |
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| 007 | cr bn||||||||| |
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| 008 | 250819e199411 oncad bt f000|| eng d |
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| 040 | |aCaOODSP|beng|erda|cCaOODSP |
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| 041 | |aeng|beng|bfre |
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| 043 | |an-cn--- |
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| 086 | 1 |aDR52-17/61-1994E-PDF |
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| 100 | 1 |aPepper, Gary T.|q(Gary Thomas),|d1958- |eauthor. |
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| 245 | 10|aCharacterization and calibration of a pulsed laser system for single event upset simulation / |cby G.T. Pepper and A. Fechete. |
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| 264 | 1|aOttawa : |bDefence Research Establishment Ottawa, |cNovember 1994. |
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| 300 | |a1 online resource (xiii, 36 pages) : |billustrations, charts. |
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| 336 | |atext|btxt|2rdacontent |
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| 337 | |acomputer|bc|2rdamedia |
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| 338 | |aonline resource|bcr|2rdacarrier |
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| 490 | 1 |aDREO report ; |vno. 1241 |
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| 500 | |aDigitized edition from print [produced by Defence Research and Development Canada]. |
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| 504 | |aIncludes bibliographical references (pages 33-34). |
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| 520 | |a"A pulsed Nd:Glass laser facility that was developed at Defence Research Establishment Ottawa, for the simulation of single event upsets (SEUs) in electronics, is described in detail. The performance of the laser system, the associated instrumentation and data acquisition systems were extensively characterized during the process of studying the charge collected in a silicon p-i-n photodiode, due to laser and ion-induced SEU. Laser simulation of SEUs is demonstrated to be an accurate, convenient, complementary method to ion accelerator-based SEU experimentation"--Abstract, page iii. |
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| 546 | |aIncludes abstracts in English and French. |
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| 650 | 0|aDirected-energy weapons. |
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| 650 | 0|aPhotodiodes. |
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| 650 | 6|aArmes à énergie dirigée. |
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| 650 | 6|aPhotodiodes. |
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| 710 | 2 |aDefence Research Establishment Ottawa, |eissuing body. |
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| 710 | 1 |aCanada. |bDepartment of National Defence, |eissuing body. |
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| 830 | #0|aDREO report ;|vno. 1241.|w(CaOODSP)9.941661 |
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| 856 | 40|qPDF|s1.62 MB|uhttps://publications.gc.ca/collections/collection_2025/rddc-drdc/DR52-17-61-1994-eng.pdf |
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