On-site analysis of wetland surface-water samples by total reflection x-ray fluorescence spectrometry / P. Pelchat ... [et al.]. : M41-11/18-2013E-PDF
For many geochemical studies, the very low detection limits of Inductively Coupled Plasma (ICP) technology are less important than the time delay and high costs associated with laboratory based analysis. Total reflection X-ray fluorescence spectroscopy (TXRF), with on-site analyses at low ppb level detection limits, offers a potential compromise. To test whether this is a suitable field technology, the Geological Survey of Canada’s TGI4 Program, in conjunction with the Inorganic Geochemical Research Laboratory (IGRL), deployed a TXRF Spectrometer (Bruker AXS – S2 Picofox) and a small field laboratory to a remote field location in Saskatchewan. ...
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| Ministère/Organisme | Canada. Natural Resources Canada. Geological Survey of Canada. |
|---|---|
| Nom de réunion | International Conference on Analytical Sciences and Spectroscopy(59th : 2013 : Mont-Tremblant (Québec)) |
| Titre | On-site analysis of wetland surface-water samples by total reflection x-ray fluorescence spectrometry / P. Pelchat ... [et al.]. |
| Titre de la série | Geological Survey of Canada, Scientific Presentation ; 18 |
| Type de publication | Série - Voir l'enregistrement principal |
| Langue | [Anglais] |
| Format | Électronique |
| Document électronique | |
| Note(s) | "Presented at the 59th International Conference on Analytical Sciences and Spectroscopy (ICASS), Date presented: June 2013." |
| Information sur la publication | [Ottawa] : Geological Survey of Canada, Natural Resources Canada, 2013. |
| Auteur / Contributeur | Pelchat, P. |
| Description | 1 poster : table, photos, graphs. |
| Numéro de catalogue |
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| Numéro de catalogue du ministère | doi:10.4095/293043 |
| Descripteurs | Geochemistry Hydrogeology Surface water Spectroscopy X-ray fluorescence |
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