Elimination of the dispersion effect in the analysis of diffraction line profiles / C. Mitchell and P.M. de Wolff, Physical Metallurgy Division. : M38-8/51E-PDF

"In the present paper a procedure is described whereby the spectral distribution of the characteristic X-ray line can be unfolded from the scattering distribution for a single crystal or powder specimen. If the measured scattering distribution has been corrected for the effects of instrumental aberrations the distribution obtained after unfolding is the true radial interference distribution defined by crystallite size, imperfections and elastic strain. Since the present treatment is free of approximations, the results are valid regardless of the width of either the spectral or the radial interference distribution. The spacing of the reciprocal lattice node is determined directly in terms of the reference wavelength and is independent of dispersion effects. If the X-ray wavelength is sharply defined, the interference function for a reflexion can be determined directly by correcting the scattering distribution for the dependence of intensity on scattering angle and mapping the distribution in reciprocal space. When, however, the incident beam has a distribution of wavelengths dispersion occurs, since the angular scattering distribution due to a given interference function is wavelength dependent"--Introd., p. 325.

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