00000nam 2200000zi 4500 9.868283 CaOODSP 20221107162537 m o d f cr nn||||||||| 190213t19851984onca ob f000 0 eng d 0660119447 (print) CaOODSP eng rda CaOODSP eng fre n-cn--- M38-13/84-15E-PDF M38-13/84-15E Leduc, J. (Jean), 1943- author. Impedance measurements at the semiconductor-solution interface / J. Leduc and S.M. Ahmed. Ottawa, Canada : Canada Centre for Mineral and Energy Technology = Centre canadien de la technologie des minéraux et de l'énergie, 1985. ©1984 1 online resource (iv, 82 pages) : illustrations. text txt rdacontent computer c rdamedia online resource cr rdacarrier CANMET report ; 84-15E Issued also in French under title: Mesures de l'impédance à l'interface semi-conducteur-solution. Cover title. "June 1985." Issued by: Energy Research Program and Mineral Sciences Laboratories. Digitized edition from print [produced by Natural Resources Canada]. Includes bibliographical references. "The physics and chemistry of the semiconductor-solution interface have been presented in detail with particular reference to impedance measurements and determination of the flat band potential of the semiconductor surface. The basic theory of A.C. circuits applied to impedance measurements at the semiconductor-solution interface has been developed. Techniques for impedance measurements and data analysis have been described for a method using an LCR meter and a computer for experimental control and data acquisition. The necessary software has been developed"--Abstract, page i. Includes abstract in French. gccst Chemistry Ahmed, S. M. (Syed M.), 1943- author. Canada. Energy, Mines and Resources Canada. Canada Centre for Mineral and Energy Technology. Energy Research Program (Canada) Mineral Sciences Laboratories (Canada) Mesures de l'impédance à l'interface semi-conducteur-solution / (CaOODSP)9.868285 CANMET report ; 84-15E. (CaOODSP)9.852792 PDF 5.44 MB https://publications.gc.ca/collections/collection_2019/rncan-nrcan/m38-13/M38-13-84-15-eng.pdf 307071