Characterization and calibration of a pulsed laser system for single event upset simulation / by G.T. Pepper and A. Fechete. : DR52-17/61-1994E-PDF
"A pulsed Nd:Glass laser facility that was developed at Defence Research Establishment Ottawa, for the simulation of single event upsets (SEUs) in electronics, is described in detail. The performance of the laser system, the associated instrumentation and data acquisition systems were extensively characterized during the process of studying the charge collected in a silicon p-i-n photodiode, due to laser and ion-induced SEU. Laser simulation of SEUs is demonstrated to be an accurate, convenient, complementary method to ion accelerator-based SEU experimentation"--Abstract, page iii.
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| Titre | Characterization and calibration of a pulsed laser system for single event upset simulation / by G.T. Pepper and A. Fechete. |
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| Type de publication | Monographie - Voir l'enregistrement principal |
| Langue | [Anglais] |
| Format | Texte numérique |
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| Description | 1 online resource (xiii, 36 pages) : illustrations, charts. |
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