An assessment of variable sample thickness for pXRF analysis of unconsolidated sediment / E. Holdsworth, R.D. Knight, L.J. Valiquette, A.R.R. Landon-Browne, and H.A.J. Russell.: M183-2/8638E-PDF
"For optimal results manufactures of pXRF spectrometers recommend analyses of samples that meet the criteria of infinite thickness, which for unconsolidated sediments is approximately 25 mm in thickness and compacted to ensure there are no air gaps. To quantify individual elemental response and the theoretical required infinite sample thickness Certified Reference Materials (CRM's) Till 1 to 4, ranging in thickness from 1 to 40 mm, were analysed in Soil and Mining mode. Results show a relationship between filters used to process data and sample thickness. For samples less than infinite thickness, pXRF analyses often returned results that were substantially greater than, or less than, results returned from samples of infinite thickness. For these samples post data collection correction factors can be applied to adjust results for greater accuracy"--Abstract, page 1.
Permanent link to this Catalogue record:
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| Title | An assessment of variable sample thickness for pXRF analysis of unconsolidated sediment / E. Holdsworth, R.D. Knight, L.J. Valiquette, A.R.R. Landon-Browne, and H.A.J. Russell. |
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| Publication type | Monograph - View Master Record |
| Language | [English] |
| Format | Digital text |
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| Description | 1 online resource (18 pages) : colour illustrations + 3 sets of graphs. |
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