An assessment of variable sample thickness for pXRF analysis of unconsolidated sediment / E. Holdsworth, R.D. Knight, L.J. Valiquette, A.R.R. Landon-Browne, and H.A.J. Russell.: M183-2/8638E-PDF

"For optimal results manufactures of pXRF spectrometers recommend analyses of samples that meet the criteria of infinite thickness, which for unconsolidated sediments is approximately 25 mm in thickness and compacted to ensure there are no air gaps. To quantify individual elemental response and the theoretical required infinite sample thickness Certified Reference Materials (CRM's) Till 1 to 4, ranging in thickness from 1 to 40 mm, were analysed in Soil and Mining mode. Results show a relationship between filters used to process data and sample thickness. For samples less than infinite thickness, pXRF analyses often returned results that were substantially greater than, or less than, results returned from samples of infinite thickness. For these samples post data collection correction factors can be applied to adjust results for greater accuracy"--Abstract, page 1.

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Publication information
Department/Agency Geological Survey of Canada, issuing body.
Title An assessment of variable sample thickness for pXRF analysis of unconsolidated sediment / E. Holdsworth, R.D. Knight, L.J. Valiquette, A.R.R. Landon-Browne, and H.A.J. Russell.
Series title Open file, 2816-7155 ; 8638
Publication type Series - View Master Record
Language [English]
Format Electronic
Electronic document
Note(s) Includes bibliographical references (pages 15-17).
Publishing information [Ottawa] : Geological Survey of Canada, 2021.
©2021
Author / Contributor Holdsworth, E. (Emily)author.
Description 1 online resource (18 pages) : colour illustrations + 3 sets of graphs.
Catalogue number
  • M183-2/8638E-PDF
Subject terms Sediments (Geology) -- Analysis.
X-ray spectroscopy.
Sédiments (Géologie) -- Analyse.
Spectroscopie des rayons X.
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