A general survey of transient-radiation effects on electronics (tree), with particular reference to semiconductor devices / by F.A. Johnson.: DR52-17/5-1972E-PDF
"The basic effects produced in semiconductors by both ionizing and displacement radiation are summarized and related to the parameter changes which are observed in semiconductor devices. Ionization and displacement effects produced by transient radiation in diodes, transistors, four-layer devices and integrated circuits are described, and a brief summary is given of the effects of radiation on miscellaneous components such as resistors, capacitors and coaxial cables. Various techniques for radiation hardening of semiconductor devices and circuits are reviewed, and methods for predicting the effects of radiation are discussed briefly"--Abstract.
Permanent link to this Catalogue record:
publications.gc.ca/pub?id=9.941857&sl=0
Department/Agency | Defence Research Establishment Ottawa, issuing body. Canada. Defence Research Board, issuing body. |
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Title | A general survey of transient-radiation effects on electronics (tree), with particular reference to semiconductor devices / by F.A. Johnson. |
Series title | DREO report ; 656 |
Publication type | Series - View Master Record |
Language | [English] |
Format | Electronic |
Electronic document | |
Note(s) | Digitized edition from print [produced by Defence Research and Development Canada]. Includes bibliographical references (pages 40-52). Includes abstracts in English and French. |
Publishing information | Ottawa : Defence Research Establishment Ottawa, April 1972. |
Author / Contributor | Johnson, F. A. (F. Allan)author. |
Description | 1 online resource (52, 2 pages). |
Catalogue number |
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Departmental catalogue number | 72-189 |
Subject terms | Semiconductors -- Effect of radiation on. Semiconductors -- Experiments. Radiation hardening -- Experiments. Ionizing radiation -- Experiments. Semi-conducteurs -- Effets du rayonnement sur. Semi-conducteurs -- Expériences. Insensibilité aux radiations -- Expériences. Rayonnement ionisant -- Expériences. |
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