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Elimination of the dispersion effect in the analysis of diffraction line profiles: M38-8/51E-PDF

"In the present paper a procedure is described whereby the spectral distribution of the characteristic X-ray line can be unfolded from the scattering distribution for a single crystal or powder specimen. If the measured scattering distribution has been corrected for the effects of instrumental aberrations the distribution obtained after unfolding is the true radial interference distribution defined by crystallite size, imperfections and elastic strain. Since the present treatment is free of approximations, the results are valid regardless of the width of either the spectral or the radial interference distribution. The spacing of the reciprocal lattice node is determined directly in terms of the reference wavelength and is independent of dispersion effects. If the X-ray wavelength is sharply defined, the interference function for a reflexion can be determined directly by correcting the scattering distribution for the dependence of intensity on scattering angle and mapping the distribution in reciprocal space. When, however, the incident beam has a distribution of wavelengths dispersion occurs, since the angular scattering distribution due to a given interference function is wavelength dependent"--Introd., p. 325.

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Department/Agency Natural Resources Canada. Dept. of Energy, Mines and Resources. Mines Branch.
Title Elimination of the dispersion effect in the analysis of diffraction line profiles
Series Title Reprint series ;
Publication Type Series - View Master Record
Language [English]
Format Electronic
Electronic Document

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Note Cover title. "Reprinted from Acta Crystallographica, Vol. 22, Part 3, 10 March 1967." Historical publication digitized from print 2017 [by Natural Resources Canada].
Date 1967.
Number of Pages p. 325-328
Catalogue Number
  • M38-8/51E-PDF
Departmental Catalogue Number 300130
Subject Terms Minerals, Physics