Impedance measurements at the semiconductor-solution interface / J. Leduc and S.M. Ahmed.: M38-13/84-15E-PDF
"The physics and chemistry of the semiconductor-solution interface have been presented in detail with particular reference to impedance measurements and determination of the flat band potential of the semiconductor surface. The basic theory of A.C. circuits applied to impedance measurements at the semiconductor-solution interface has been developed. Techniques for impedance measurements and data analysis have been described for a method using an LCR meter and a computer for experimental control and data acquisition. The necessary software has been developed"--Abstract, page i.
Permanent link to this Catalogue record:
publications.gc.ca/pub?id=9.868283&sl=0
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| Title | Impedance measurements at the semiconductor-solution interface / J. Leduc and S.M. Ahmed. |
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| Publication type | Monograph - View Master Record |
| Language | [English] |
| Other language editions | [French] |
| Format | Digital text |
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| Description | 1 online resource (iv, 82 pages) : illustrations. |
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| Departmental catalogue number | 307071 |
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